Characterization of oxide/semiconductor interfaces for CMOS technologies :
Characterization of oxide/semiconductor interfaces for CMOS technologies : April 9-13, 2007, San Francisco, California, USA
- Warrendale, Pa. : Materials Research Society, c2007
- 174 p. : ill. ; 24 cm
- Materials Research Society symposium proceedings, v. 996 0272-9172 ; .
- Materials Research Society symposia proceedings ; v. 996 .
"Printed from e-media with permission by: Curran Associates, Inc." "Spring 2007"--Cover [Held 2007 MRS Spring Meeting in San Francisco, California]
Includes bibliographical references and indexes
9781605604282 1605604283
Metal oxide semiconductors, Complementary--Congresses
Metal oxide semiconductors--Materials--Congresses
Thin films--Materials--Congresses
Semiconductors--Junctions--Congresses
TK7871.99.M44 / C427 2007
617.440592/ / NEU
"Printed from e-media with permission by: Curran Associates, Inc." "Spring 2007"--Cover [Held 2007 MRS Spring Meeting in San Francisco, California]
Includes bibliographical references and indexes
9781605604282 1605604283
Metal oxide semiconductors, Complementary--Congresses
Metal oxide semiconductors--Materials--Congresses
Thin films--Materials--Congresses
Semiconductors--Junctions--Congresses
TK7871.99.M44 / C427 2007
617.440592/ / NEU