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Characterization of oxide/semiconductor interfaces for CMOS technologies : April 9-13, 2007, San Francisco, California, USA by Series: Materials Research Society symposia proceedings ; v. 996
Material type: Text Text; Format: print available online remote; Literary form: Not fiction
Publication details: Warrendale, Pa. : Materials Research Society, c2007
Availability: Items available for loan: SUN - Main Library (1)Call number: 617.440592/ NEU.

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