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Characterization of oxide/semiconductor interfaces for CMOS technologies : April 9-13, 2007, San Francisco, California, USA

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Item type	Current library	Collection	Call number	Status	Date due
Books	SUN - Main Library General Shelves	Text Books	617.440592/ NEU (Browse shelf(Opens below))	Available

"Printed from e-media with permission by: Curran Associates, Inc."

"Spring 2007"--Cover

[Held 2007 MRS Spring Meeting in San Francisco, California]

Includes bibliographical references and indexes

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