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Characterization of oxide/semiconductor interfaces for CMOS technologies : April 9-13, 2007, San Francisco, California, USA

Contributor(s): Material type: TextTextSeries: Materials Research Society symposia proceedings ; v. 996Publication details: Warrendale, Pa. : Materials Research Society, c2007Description: 174 p. : ill. ; 24 cmISBN:
  • 9781605604282
  • 1605604283
Subject(s): DDC classification:
  • 617.440592/ NEU
LOC classification:
  • TK7871.99.M44 C427 2007
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Item type Current library Collection Call number Status Date due Barcode
Books SUN - Main Library General Shelves Text Books 617.440592/ NEU (Browse shelf(Opens below)) Available 2018-5888

"Printed from e-media with permission by: Curran Associates, Inc."

"Spring 2007"--Cover

[Held 2007 MRS Spring Meeting in San Francisco, California]

Includes bibliographical references and indexes

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