Characterization of oxide/semiconductor interfaces for CMOS technologies : April 9-13, 2007, San Francisco, California, USA
Material type: TextSeries: Materials Research Society symposia proceedings ; v. 996Publication details: Warrendale, Pa. : Materials Research Society, c2007Description: 174 p. : ill. ; 24 cmISBN:- 9781605604282
- 1605604283
- 617.440592/ NEU
- TK7871.99.M44 C427 2007
Item type | Current library | Collection | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|---|
Books | SUN - Main Library General Shelves | Text Books | 617.440592/ NEU (Browse shelf(Opens below)) | Available | 2018-5888 |
"Printed from e-media with permission by: Curran Associates, Inc."
"Spring 2007"--Cover
[Held 2007 MRS Spring Meeting in San Francisco, California]
Includes bibliographical references and indexes
Also available online
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